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ISQED
2007
IEEE
148views Hardware» more  ISQED 2007»
14 years 2 months ago
On Accelerating Soft-Error Detection by Targeted Pattern Generation
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
DDECS
2007
IEEE
90views Hardware» more  DDECS 2007»
13 years 12 months ago
Test Pattern Generator for Delay Faults
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
Tomasz Rudnicki, Andrzej Hlawiczka
IROS
2009
IEEE
160views Robotics» more  IROS 2009»
14 years 2 months ago
Toward human-like walking pattern generator
— In this paper, we generate the biped gait of a humanoid robot that looks like a human’s one. To generate the human like motion, we first capture walking motion of a human. T...
Kensuke Harada, Kanako Miura, Mitsuharu Morisawa, ...
CORR
2011
Springer
151views Education» more  CORR 2011»
13 years 2 months ago
A Simulation Experiment on a Built-In Self Test Equipped with Pseudorandom Test Pattern Generator and Multi-Input Shift Register
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
A. Ahmad
DATE
2009
IEEE
94views Hardware» more  DATE 2009»
14 years 2 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...