-- In previous work, Hu and Dill identified a common cause of BDD-size blowup in high-level design verification and proposed the method of implicitly conjoined invariants to addres...
We describe a gate level design of a FlexRay-like bus interface. An electronic control unit (ECU) is obtained by integrating this interface into the design of the verified VAMP pro...
This paper presents new technology that accelerates system verification. Traditional methods for verifying functional designs are based on logic simulation, which becomes more tim...
Young-Il Kim, Woo-Seung Yang, Young-Su Kwon, Chong...
VLSI engineers have traditionally used a variety of CAD analysis tools (e.g. SPICE) to deal with variability. As we go into deep sub micron issues, the analysis is becoming harder...
Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, De...
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...