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DAC
1994
ACM
14 years 1 months ago
New Techniques for Efficient Verification with Implicitly Conjoined BDDs
-- In previous work, Hu and Dill identified a common cause of BDD-size blowup in high-level design verification and proposed the method of implicitly conjoined invariants to addres...
Alan J. Hu, Gary York, David L. Dill
BIRTHDAY
2006
Springer
14 years 1 months ago
Realistic Worst-Case Execution Time Analysis in the Context of Pervasive System Verification
We describe a gate level design of a FlexRay-like bus interface. An electronic control unit (ECU) is obtained by integrating this interface into the design of the verified VAMP pro...
Steffen Knapp, Wolfgang J. Paul
DAC
2004
ACM
14 years 1 months ago
Communication-efficient hardware acceleration for fast functional simulation
This paper presents new technology that accelerates system verification. Traditional methods for verifying functional designs are based on logic simulation, which becomes more tim...
Young-Il Kim, Woo-Seung Yang, Young-Su Kwon, Chong...
DAC
2006
ACM
14 years 3 months ago
Variation-aware analysis: savior of the nanometer era?
VLSI engineers have traditionally used a variety of CAD analysis tools (e.g. SPICE) to deal with variability. As we go into deep sub micron issues, the analysis is becoming harder...
Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, De...
DAC
2011
ACM
12 years 9 months ago
Rethinking memory redundancy: optimal bit cell repair for maximum-information storage
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
Xin Li