1419 search results - page 4 / 284 » Power Droop Testing |
ICCD
2003
IEEE
14 years 1 months ago
2003
IEEE
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
DSD
2005
IEEE
14 years 2 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
MTV
2007
IEEE
14 years 2 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
ISQED
2009
IEEE
14 years 3 months ago
2009
IEEE
CSDA
2011
13 years 3 months ago
2011
: A multiple test procedure for assessing multivariate normality (MVN) that combines a finite set of affine invariant test statistics for MVN is proposed. This combination is base...