1419 search results - page 8 / 284 » Power Droop Testing |
ICCAD
2010
IEEE
13 years 7 months ago
2010
IEEE
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
HICSS
1998
IEEE
14 years 2 months ago
1998
IEEE
This paper describes the uses and architecture of a network-centered computing-rich software platform called PowerWeb. PowerWeb was designed and built as a simulation environment ...
EVOW
1999
Springer
14 years 2 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
VTS
1998
IEEE
14 years 2 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
ATS
2005
IEEE
14 years 3 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...