Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Abstract—The dynamic power consumed by a digital CMOS circuit is directly proportional to capacitance. In this paper, we consider pre-routing capacitance estimation for FPGAs and...
This paper investigates experimentally the quantitative impact of pipelining on energy per operation for two representative FPGA devices: a 0.13µm CMOS high density/high speed FPG...
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...