129 search results - page 16 / 26 » Process Variations and their Impact on Circuit Operation |
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
ISVLSI
2002
IEEE
14 years 8 days ago
2002
IEEE
With technology scaling, power supply and threshold voltage continue to decrease to satisfy high performance and low power requirements. In the past, subthreshold CMOS circuits ha...
MICRO
2009
IEEE
14 years 2 months ago
2009
IEEE
Process variations in integrated circuits have significant impact on their performance, leakage and stability. This is particularly evident in large, regular and dense structures...
VTS
2002
IEEE
14 years 7 days ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
Abstract--Phase-Change Random Access Memory (PRAM) has become one of the most promising emerging memory technologies, due to its attractive features such as high density, fast acce...