129 search results - page 20 / 26 » Process Variations and their Impact on Circuit Operation |
IOLTS
2006
IEEE
14 years 1 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Static timing analysis is a critical step in design of any digital integrated circuit. Technology and design trends have led to significant increase in environmental and process v...
DAC
2011
ACM
12 years 7 months ago
2011
ACM
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
A low-power frequency multiplication technique, developed for ZigBee (IEEE 802.15.4) like applications is presented. We have provided an estimate for the power consumption for a g...
VLSID
2010
IEEE
13 years 5 months ago
2010
IEEE
Due to the inherent nature of heat flow in 3D integrated circuits, stacked dies exhibit a wide range of thermal characteristics. The strong dependence of leakage with temperature...