129 search results - page 6 / 26 » Process Variations and their Impact on Circuit Operation |
ISVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...
DATE
2010
IEEE
14 years 13 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Manufacturing disturbances are inevitable in the fabrication of integrated circuits. These disturbances will result in variations in the delay speci cations of manufactured circui...
ASPDAC
2009
ACM
14 years 1 months ago
2009
ACM
— Recent advances in statistical timing analysis (SSTA) achieve great success in computing arrival times under variations by extending sum and maximum operations to random variab...
DATE
2005
IEEE
13 years 9 months ago
2005
IEEE
Operating frequency of a pipelined circuit is determined by the delay of the slowest pipeline stage. However, under statistical delay variation in sub-100nm technology regime, the...