46 search results - page 3 / 10 » Process variation aware cache leakage management |
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
Deep-submicron designs have to take care of process variation effects as variations in critical process parameters result in large variations in access latencies of hardware compo...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
this paper proposes a novel Process Variation Aware SRAM architecture designed to inherently support voltage scaling. The peripheral circuitry of the SRAM is modified to selectivel...
ASPDAC
2007
ACM
13 years 10 months ago
2007
ACM
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
In sub-90nm process technology it becomes harder to control the fabrication process, which in turn causes variations between the design-time parameters and the fabricated paramete...
MICRO
2007
IEEE
14 years 2 months ago
2007
IEEE
Process variations will greatly impact the stability, leakage power consumption, and performance of future microprocessors. These variations are especially detrimental to 6T SRAM ...