137 search results - page 16 / 28 » Process variation dimension reduction based on SVD |
VLSID
2010
IEEE
13 years 11 months ago
2010
IEEE
A novel design approach for simultaneous power and stability (static noise margin, SNM) optimization of nanoCMOS static random access memory (SRAM) is presented. A 45nm single-end...
ENGL
2007
13 years 7 months ago
2007
— Most research in Knowledge Mining deal with the basic models like clustering, classification, regression, association rule mining and so on. In the process of quest for knowled...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
For CMOS technologies below 65nm, gate oxide direct tunneling current is a major component of the total power dissipation. This paper presents a simulated annealing based algorith...
ICIP
2006
IEEE
14 years 9 months ago
2006
IEEE
We focus on motion estimation using a block matching approach and suggest using a minimum-entropy criterion. Many entropy-based estimation procedures exist, such as plug-in estima...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
In this paper we introduce a new algorithm for model order reduction in the presence of parameter or process variation. Our analysis is performed using a graph interpretation of t...