102 search results - page 8 / 21 » Pseudo-Exhaustive Testing of Sequential Circuits |
TCAD
1998
13 years 7 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...
DAC
1995
ACM
13 years 11 months ago
1995
ACM
Abstract A new method for power estimation in sequential circuits is presented that is based on a statistical estimation technique. By applying randomly generated input sequences t...
GLVLSI
2010
IEEE
14 years 22 days ago
2010
IEEE
In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
DATE
1997
IEEE
14 years 3 days ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...