201 search results - page 8 / 41 » Reducing Test Application Time Through Test Data Mutation En... |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Functional, instruction-based self-testing of microprocessors has recently emerged as an effective alternative or supplement to other testing approaches, and is progressively adop...
JDWM
2007
13 years 7 months ago
2007
This article presents a new evolutionary algorithm (EA) for induction of mixed decision trees. In nonterminal nodes of a mixed tree, different types of tests can be placed, rangin...
TIT
2008
13 years 7 months ago
2008
Abstract--We investigate two closely related successive refinement (SR) coding problems: 1) In the hypothesis testing (HT) problem, bivariate hypothesis H0 : PXY against H1 : PXPY ...
WSC
2007
13 years 10 months ago
2007
The need for interoperability of information systems among supply chain partners has been recognized. A number of standards have been or are being developed to ensure interoperabi...