20 search results - page 3 / 4 » Reducing test data volume using external LBIST hybrid test p... |
ATS
2005
IEEE
14 years 3 months ago
2005
IEEE
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
ISVLSI
2008
IEEE
14 years 4 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
DFT
2003
IEEE
14 years 3 months ago
2003
IEEE
A new hybrid BIST scheme is proposed which is based on using an “incrementally guided LFSR.” It very efficiently combines external deterministic data from the tester with on-c...
ICCD
2003
IEEE
14 years 6 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...