492 search results - page 92 / 99 » Reliability and Fault Tolerance in Trust |
DAC
2001
ACM
14 years 8 months ago
2001
ACM
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...
LCTRTS
2009
Springer
14 years 2 months ago
2009
Springer
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...
MICRO
2009
IEEE
14 years 2 months ago
2009
IEEE
Many-core scaling now faces a power wall. The gap between the number of cores that fit on a die and the number that can operate simultaneously under the power budget is rapidly i...
ASPLOS
2006
ACM
14 years 1 months ago
2006
ACM
Concurrency bugs are among the most difficult to test and diagnose of all software bugs. The multicore technology trend worsens this problem. Most previous concurrency bug detect...
DATE
2010
IEEE
14 years 17 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...