282 search results - page 35 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
DAC
2010
ACM
14 years 28 days ago
2010
ACM
As the geometry shrinking faces severe limitations, 3D wafer stacking with through silicon via (TSV) has gained interest for future SOC integration. Since TSV fill material and s...
FPGA
2010
ACM
13 years 7 months ago
2010
ACM
Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...
ICPR
2004
IEEE
14 years 10 months ago
2004
IEEE
Parallel processors such as SIMD computers have been successfully used in various areas of high performance image and data processing. Due to their characteristics of highly regula...
SEUS
2010
IEEE
13 years 6 months ago
2010
IEEE
Abstract. Ubiquitous embedded computing systems expected to reliably perform one or more relevant tasks need design and verification methods currently not available. New envisioned...