282 search results - page 3 / 57 » Reliability- and process-variation aware design of integrate... |
MR
2008
13 years 7 months ago
2008
HPCA
2009
IEEE
14 years 1 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
We model and verify analog designs in the presence of noise and process variation using an automated theorem prover, MetiTarski. Due to the statistical nature of noise, we propose ...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
In this paper, we present a method for analyzing the leakage current, and hence the leakage power, of a circuit under process parameter variations that can include spatial correla...