282 search results - page 4 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...
ISVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Process induced threshold voltage variations bring about fluctuations in circuit delay, that affect the FPGA timing yield. We propose an adaptive FPGA architecture that compensate...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...