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ICCAD
1996
IEEE
121views Hardware» more  ICCAD 1996»
13 years 11 months ago
Identification of unsettable flip-flops for partial scan and faster ATPG
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
DATE
2006
IEEE
104views Hardware» more  DATE 2006»
14 years 1 months ago
Optimizing sequential cycles through Shannon decomposition and retiming
—Optimizing sequential cycles is essential for many types of high-performance circuits, such as pipelines for packet processing. Retiming is a powerful technique for speeding pip...
Cristian Soviani, Olivier Tardieu, Stephen A. Edwa...
IH
1998
Springer
13 years 11 months ago
Fingerprinting Digital Circuits on Programmable Hardware
Advanced CAD tools and high-density VLSI technologies have combined to create a new market for reusable digital designs. The economic viability of the new core-based design paradig...
John Lach, William H. Mangione-Smith, Miodrag Potk...
ISQED
2006
IEEE
153views Hardware» more  ISQED 2006»
14 years 1 months ago
Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
Chong Zhao, Sujit Dey
DAC
1994
ACM
13 years 11 months ago
Clock Grouping: A Low Cost DFT Methodology for Delay Testing
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
Wen-Chang Fang, Sandeep K. Gupta