: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATPG performance while keeping acceptable area and performance overheads. Several ...
Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda,...
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
Limited Switch Dynamic Logic (LSDL), a high performance logic circuit, has been modified by introducing a pseudo-nMOS style load. The resultant circuit consumes less power, primar...
Jayakumaran Sivagnaname, Hung C. Ngo, Kevin J. Now...
— There is a long history of investigations and debates on whether a sequence of retiming and resynthesis is complete for all sequential transformations (on steady states). It ha...