768 search results - page 65 / 154 » Robustness of Sequential Circuits |
GECCO
2003
Springer
14 years 2 months ago
2003
Springer
This poster paper summarizes our research on fault tolerance arising as a by-product of the evolutionary computation process. Past research has shown evidence of robustness emergin...
PATMOS
2007
Springer
14 years 2 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
ICCAD
2009
IEEE
13 years 6 months ago
2009
IEEE
Process and environmental variations continue to present significant challenges to designers of high-performance integrated circuits. In the past few years, while much research has...
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
A methodology is proposed for designing robust circuits exhibiting higher tolerance to process and environmental variations. This higher tolerance is achieved by exploiting the in...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These set...