This poster paper summarizes our research on fault tolerance arising as a by-product of the evolutionary computation process. Past research has shown evidence of robustness emergin...
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
Chin-Hsiung Hsu, Szu-Jui Chou, Jie-Hong Roland Jia...
Process and environmental variations continue to present significant challenges to designers of high-performance integrated circuits. In the past few years, while much research has...
Khaled R. Heloue, Chandramouli V. Kashyap, Farid N...
A methodology is proposed for designing robust circuits exhibiting higher tolerance to process and environmental variations. This higher tolerance is achieved by exploiting the in...
In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These set...
Robert Schwencker, Frank Schenkel, Michael Pronath...