12 search results - page 1 / 3 » SEAT-LA: A Soft Error Analysis Tool for Combinational Logic |
VLSID
2006
IEEE
14 years 11 months ago
2006
IEEE
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
VLSID
2007
IEEE
14 years 11 months ago
2007
IEEE
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
DATE
2009
IEEE
14 years 5 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
ISQED
2006
IEEE
14 years 5 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
DATE
2005
IEEE
14 years 4 months ago
2005
IEEE
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...