103 search results - page 20 / 21 » SEU tolerant device, circuit and processor design |
ASAP
2008
IEEE
14 years 4 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
ISPD
2004
ACM
14 years 3 months ago
2004
ACM
Modern processors and SoCs require the adoption of poweroriented design styles, due to the implications that power consumption may have on reliability, cost and manufacturability ...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
attributed to the high regularity of memories, PAs and FPGAs, and the ease with which they can be tested and reconfigured to avoid faulty elements. Digital microfluidicsbased bioch...
CASES
2006
ACM
14 years 1 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
GLVLSI
2009
IEEE
2009
IEEE
Physical unclonable function and true random number generator: a compact and scalable implementation
14 years 1 months ago
Physical Unclonable Functions (PUF) and True Random Number Generators (TRNG) are two very useful components in secure system design. PUFs can be used to extract chip-unique signat...