— Accurate estimation of worst-case crosstalk effects is critical for a realistic estimation of the worst-case behavior of deep sub-micron circuits. Crosstalk analysis models usu...
Murthy Palla, Klaus Koch, Jens Bargfrede, Manfred ...
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
The recent demand for system-on-chip RF mixed-signal design and aggressive supply-voltage reduction require chip-level accurate analysis of both the substrate and power delivery s...
Tsung-Hao Chen, Clement Luk, Charlie Chung-Ping Ch...
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...
Jinjun Xiong, Vladimir Zolotov, Chandu Visweswaria...
Abstract—Active measurements on network paths provide endto-end network health status in terms of metrics such as bandwidth, delay, jitter and loss. Hence, they are increasingly ...