A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
In this paper, we propose an approach to the transient and steady-state analysis of the affine combination of one fast and one slow adaptive filters. The theoretical models are bas...
Renato Candido, Magno T. M. Silva, Vitor H. Nascim...
In this paper, we propose fast and efficient techniques to analyze the power grid with accurate modeling of the transistor network. The solution techniques currently available for...
Anand Ramalingam, Giri Devarayanadurg, David Z. Pa...