376 search results - page 25 / 76 » Self-Assembled Circuit Patterns |
FPGA
2005
ACM
14 years 1 months ago
2005
ACM
Modern FPGA architectures provide ample routing resources so that designs can be routed successfully. The routing architecture is designed to handle versatile connection configur...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
DELTA
2008
IEEE
14 years 2 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
COCO
2009
Springer
14 years 2 months ago
2009
Springer
—We show that the rank of a depth-3 circuit (over any field) that is simple, minimal and zero is at most O(k3 log d). The previous best rank bound known was 2O(k2 ) (log d)k−2...
3DIC
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Modeling parasitic parameters of Through-SiliconVia (TSV) structures is essential in exploring electrical characteristics such as delay and signal integrity (SI) of circ...