376 search results - page 38 / 76 » Self-Assembled Circuit Patterns |
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
Compare CMOS Logic with Pass-Transistor Logic, a question was raised in our mind: "Does any rule exist that contains all good?" This paper reveals novel logic synthesis ...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ICCD
2001
IEEE
14 years 4 months ago
2001
IEEE
We present a simulation-based semi-formal verification method for sequential circuits described at the registertransfer level. The method consists of an iterative loop where cove...