376 search results - page 8 / 76 » Self-Assembled Circuit Patterns |
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
Estimation of maximal power consumption is an essential task in VLSI circuit realizations since power value significantly affects the reliability of the circuits. The key issue o...
ET
2000
13 years 7 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
CP
1998
Springer
13 years 11 months ago
1998
Springer
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
TCS
2002
13 years 7 months ago
2002
One of the most basic pattern recognition problems is whether a certain local feature occurs in some linear array to the left of some other local feature. We construct in this art...
VLSID
2002
IEEE
14 years 7 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...