302 search results - page 3 / 61 » Sequential circuits for program analysis |
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
ICSE
2007
IEEE-ACM
14 years 7 months ago
2007
IEEE-ACM
The Alloy tool-set has been gaining popularity as an alternative to traditional manual testing and checking for design correctness. Alloy uses a first-order relational logic for m...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
With deep-sub-micron (DSM) technology, statistical timing analysis becomes increasingly crucial to characterize signal transmission over global interconnect wires. In this paper, ...
ACSD
2010
IEEE
13 years 5 months ago
2010
IEEE
Digital components play a central role in the design of complex embedded systems. These components are interconnected with other, possibly analog, devices and the physical environm...
ISLPED
2003
ACM
14 years 27 days ago
2003
ACM
The power consumption of a sequential circuit can be reduced by decomposing it into subcircuits which can be turned off when inactive. Power can also be reduced by careful state e...