As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...