42 search results - page 7 / 9 » Signature Rollback - A Technique for Testing Robust Circuits |
HOST
2008
IEEE
14 years 2 months ago
2008
IEEE
—A number of applications depend on the protection of security-sensitive hardware, preventing unauthorized users from gaining access to the functionality of the integrated circui...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
ATS
2003
IEEE
14 years 1 months ago
2003
IEEE
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...