NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...
In this paper, the problem of sizing MOS Current Mode Logic (MCML) circuits is addressed. The Pareto front is introduced as a useful analysis tool to explore the design space of e...
Roberto Pereira-Arroyo, Pablo Alvarado-Moya, Wolfg...
Leakage power has grown significantly and is a major challenge in SoC design. Among SoC's components, clock distribution network power accounts for a large portion of chip po...
Houman Homayoun, Shahin Golshan, Eli Bozorgzadeh, ...
As technology advances, the metal width is decreasing with the length increasing, making the resistance along the power line increase substantially. Together with the nonlinear sc...