137 search results - page 9 / 28 » Simulation methods for RF integrated circuits |
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
In this paper, we present a new voltage IR drop analysis approach for large on-chip power delivery networks. The new approach is based on recently proposed sampling based reductio...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Automated analog sizing is becoming an unavoidable solution for increasing analog design productivity. The complexity of typical analog SoC subsystems however calls for efficient ...
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Numerous machine-learning-based test methodologies have been proposed in recent years as a fast alternative to the standard functional testing of mixed-signal/RF integr...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces. Testing of electronic systems (both integrated circui...
ICCAD
2000
IEEE
13 years 11 months ago
2000
IEEE
A high accuracy system for transistor-level static timing analysis is presented. Accurate static timing verification requires that individual gate and interconnect delays be accu...