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DAC
2001
ACM
14 years 8 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
VLSID
2003
IEEE
148views VLSI» more  VLSID 2003»
14 years 7 months ago
Extending Platform-Based Design to Network on Chip Systems
Exploitation of silicon capacity will require improvements in design productivity and more scalable system paradigms. Asynchronous message passing networks on chip (NOC) have been...
Juha-Pekka Soininen, Axel Jantsch, Martti Forsell,...
DAC
1999
ACM
13 years 11 months ago
IC Test Using the Energy Consumption Ratio
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
Wanli Jiang, Bapiraju Vinnakota
DAC
2005
ACM
13 years 9 months ago
Unified high-level synthesis and module placement for defect-tolerant microfluidic biochips
Microfluidic biochips promise to revolutionize biosensing and clinical diagnostics. As more bioassays are executed concurrently on a biochip, system integration and design complex...
Fei Su, Krishnendu Chakrabarty
CG
2007
Springer
13 years 7 months ago
Fast continuous collision detection among deformable models using graphics processors
We present an interactive algorithm to perform continuous collision detection between general deformable models using graphics processors (GPUs). We model the motion of each objec...
Naga K. Govindaraju, Ilknur Kabul, Ming C. Lin, Di...