78 search results - page 8 / 16 » Simultaneous buffer and wire sizing for performance and powe... |
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
Power consumption has gained much saliency in circuit design recently. One design problem is modelled as ”Under a timing constraint, to minimize power as much as possible”. Pr...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
—Connecting system-level performance models with circuit information has been a long-standing problem in analog/mixed-signal front-ends, like radios and high-speed links. High-sp...
ASAP
2006
IEEE
13 years 9 months ago
2006
IEEE
In today's embedded systems, memory hierarchy is rapidly becoming a major factor in terms of power, performance and area. This is especially true for embedded multimedia appl...