It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presen...
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...
Trung T. Dinh-Trong, Sudipto Ghosh, Robert B. Fran...
Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...
—This paper introduces a novel optimization paradigm for increasing the throughput of digital systems. The basic idea consists of transforming fixed-latency units into variable-...
Sensor networks consist of a potentially huge number of very small and resource limited self-organizing devices. This paper presents the design of a general distributed service dir...