205 search results - page 6 / 41 » SoC Design and Test Considerations |
TVLSI
2008
13 years 6 months ago
2008
Lifetime concerns for complex systems-on-a-chip (SoC) designs due to decreasing levels in reliability motivate the development of solutions to ensure reliable operation. A precurso...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...
DATE
2003
IEEE
14 years 3 hour ago
2003
IEEE
One of the difficult problems which core-based systemon-chip (SoC) designs face is test access. For testing the cores in a SoC, a special mechanism is required, since they are no...
ISQED
2006
IEEE
14 years 22 days ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
DAC
2008
ACM
14 years 7 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...