In this paper, we present a probabilistic simulation technique to estimate the power consumption of a cmos circuit under a general delay model. This technique is based on the noti...
CT An efficient statistical timing analysis algorithm that can handle arbitrary (spatial and structural) causes of delay correlation is described. The algorithm derives the entire ...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...