Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodr...
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
Oscar Ruano, Pilar Reyes, Juan Antonio Maestro, Lu...
This paper presents a low-power soft error-hardened latch suitable for reliable circuit operation. The proposed circuit uses redundant feedback loop to protect latch against soft e...