98 search results - page 10 / 20 » Soft error rate analysis for sequential circuits |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...
CSREAESA
2006
13 years 9 months ago
2006
- Triple Modular Redundancy is widely used in dependable systems design to ensure high reliability against soft errors. Conventional TMR is effective in protecting sequential circu...
ISQED
2008
IEEE
14 years 2 months ago
2008
IEEE
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
LCTRTS
2010
Springer
14 years 13 days ago
2010
Springer
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...