98 search results - page 6 / 20 » Soft error rate analysis for sequential circuits |
IOLTS
2007
IEEE
14 years 1 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...