In this paper is described a software technique allowing to detect soft errors occurring in processor-based digital architectures. The detection mechanism is based on a set of rul...
A significant fraction of soft errors in modern microprocessors has been reported to never lead to a system failure. Any concurrent error detection scheme that raises alarm every ...
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
Abstract. Software designs equipped with specification of dependability techniques can help engineers to develop critical systems. In this work, we start to envision how a softwar...
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...