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ICCD
2006
IEEE
157views Hardware» more  ICCD 2006»
14 years 4 months ago
Statistical Analysis of Power Grid Networks Considering Lognormal Leakage Current Variations with Spatial Correlation
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
Ning Mi, Jeffrey Fan, Sheldon X.-D. Tan
DAC
2005
ACM
14 years 8 months ago
Full-chip analysis of leakage power under process variations, including spatial correlations
In this paper, we present a method for analyzing the leakage current, and hence the leakage power, of a circuit under process parameter variations that can include spatial correla...
Hongliang Chang, Sachin S. Sapatnekar
ICCD
2007
IEEE
322views Hardware» more  ICCD 2007»
14 years 4 months ago
Voltage drop reduction for on-chip power delivery considering leakage current variations
In this paper, we propose a novel on-chip voltage drop reduction technique for on-chip power delivery networks of VLSI systems in the presence of variational leakage current sourc...
Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan
DAC
2006
ACM
14 years 8 months ago
Stochastic variational analysis of large power grids considering intra-die correlations
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhar...
DATE
2007
IEEE
118views Hardware» more  DATE 2007»
14 years 2 months ago
Statistical model order reduction for interconnect circuits considering spatial correlations
In this paper, we propose a novel statistical model order reduction technique, called statistical spectrum model order reduction (SSMOR) method, which considers both intra-die and...
Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan, Yici Cai,...