1459 search results - page 17 / 292 » Statistical Modeling for Circuit Simulation |
DAC
1996
ACM
13 years 11 months ago
1996
ACM
Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...
ICCD
2001
IEEE
14 years 4 months ago
2001
IEEE
CMOS Phase-locked loops (PLL) are ubiquitous in RF and mixed-signal integrated circuits. PLLs are very sensitive to noise fluctuations on the power and ground rails. In this paper...
DAC
1995
ACM
13 years 11 months ago
1995
ACM
Abstract A new method for power estimation in sequential circuits is presented that is based on a statistical estimation technique. By applying randomly generated input sequences t...
ICES
2003
Springer
14 years 24 days ago
2003
Springer
In this paper, we show how artificial evolution can be used to improve the fault-tolerance of electronic circuits. We show that evolution is able to improve the fault tolerance of...
BMAS
2000
IEEE
14 years 9 hour ago
2000
IEEE
In this paper the problem of accommodating particular analog system models, with emphasis on interconnection's representation, with discrete event simulators, and particularl...