1459 search results - page 43 / 292 » Statistical Modeling for Circuit Simulation |
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
We model and verify analog designs in the presence of noise and process variation using an automated theorem prover, MetiTarski. Due to the statistical nature of noise, we propose ...
DAC
2004
ACM
14 years 11 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
ICCAD
2005
IEEE
14 years 6 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
GLVLSI
2003
IEEE
14 years 3 months ago
2003
IEEE
Modeling on-chip inductive effects for interconnects of multigigahertz microprocessors remains challenging. SPICE simulation of these effects is very slow because of the large num...
DAC
2007
ACM
14 years 11 months ago
2007
ACM
The number and magnitude of process variation sources are increasing as we scale further into the nano regime. Today's most successful response surface methods limit us to lo...