Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a “device file setting” ...
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
This paper discusses clock skew due to manufacturing variability and environmental change. In clock tree design, transition time constraint is an important design parameter that c...
Statistical static timing analysis (SSTA) plays a key role in determining performance of the VLSI circuits implemented in state-of-the-art CMOS technology. A pre-requisite for emp...