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DAC
2004
ACM
14 years 11 months ago
Large-scale full-wave simulation
We describe a new extraction tool, EMX (Electro-Magnetic eXtractor), for the analysis of RF, analog and high-speed digital circuits. EMX is a fast full-wave field solver. It incor...
Sharad Kapur, David E. Long
ICCD
2006
IEEE
138views Hardware» more  ICCD 2006»
14 years 7 months ago
Delay and Area Efficient First-level Cache Soft Error Detection and Correction
—Soft error rates are an increasing problem in modern VLSI circuits. Commonly used error correcting codes reduce soft error rates in large memories and second level caches but ar...
Karl Mohr, Lawrence Clark
ICCAD
2006
IEEE
124views Hardware» more  ICCAD 2006»
14 years 7 months ago
Simultaneous power and thermal integrity driven via stapling in 3D ICs
The existing work on via-stapling in 3D integrated circuits optimizes power and thermal integrity separately and uses steadystate thermal analysis. This paper presents the first ...
Hao Yu, Joanna Ho, Lei He
ICCAD
2004
IEEE
150views Hardware» more  ICCAD 2004»
14 years 7 months ago
Cost-effective radiation hardening technique for combinational logic
— A radiation hardening technique for combinational logic circuits is described. The key idea is to exploit the asymmetric logical masking probabilities of gates, hardening gates...
Quming Zhou, Kartik Mohanram
DATE
2009
IEEE
122views Hardware» more  DATE 2009»
14 years 5 months ago
Analysis and optimization of NBTI induced clock skew in gated clock trees
NBTI (Negative Bias Temperature Instability) has emerged as the dominant PMOS device failure mechanism for sub100nm VLSI designs. There is little research to quantify its impact o...
Ashutosh Chakraborty, Gokul Ganesan, Anand Rajaram...