: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
Abstract— This paper describes the first VLSI implementation of lattice reduction (LR) aided multi-antenna broadcast precoding with vector perturbation. The considered LR scheme...
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
Clock skew scheduling has been traditionally considered as a tool for improving the clock period in a sequential circuit. Timing slack is "stolen" from fast combinationa...