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DATE
2008
IEEE
122views Hardware» more  DATE 2008»
14 years 4 months ago
Digital bit stream jitter testing using jitter expansion
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...
Hyun Choi, Abhijit Chatterjee
ASPDAC
2006
ACM
157views Hardware» more  ASPDAC 2006»
14 years 4 months ago
Delay modeling and static timing analysis for MTCMOS circuits
- One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In this paper, we propose a delay modeling and static timing analysis (STA) methodology ta...
Naoaki Ohkubo, Kimiyoshi Usami
DATE
2005
IEEE
122views Hardware» more  DATE 2005»
14 years 4 months ago
Diagnostic and Detection Fault Collapsing for Multiple Output Circuits
We discuss fault equivalence and dominance relations for multiple output combinational circuits. The conventional definition for equivalence says that “Two faults are equivalen...
Raja K. K. R. Sandireddy, Vishwani D. Agrawal
DAC
2004
ACM
14 years 11 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
CASES
2006
ACM
14 years 4 months ago
Architecture and circuit techniques for low-throughput, energy-constrained systems across technology generations
Rising interest in the applications of wireless sensor networks has spurred research in the development of computing systems for lowthroughput, energy-constrained applications. Un...
Mark Hempstead, Gu-Yeon Wei, David Brooks