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AAAI
2011
12 years 10 months ago
Lossy Conservative Update (LCU) Sketch: Succinct Approximate Count Storage
In this paper, we propose a variant of the conservativeupdate Count-Min sketch to further reduce the overestimation error incurred. Inspired by ideas from lossy counting, we divid...
Amit Goyal, Hal Daumé III
ICCD
2006
IEEE
84views Hardware» more  ICCD 2006»
14 years 7 months ago
Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Y...
ISQED
2008
IEEE
153views Hardware» more  ISQED 2008»
14 years 4 months ago
ILP Based Gate Leakage Optimization Using DKCMOS Library during RTL Synthesis
In this paper dual-K (DKCMOS) technology is proposed as a method for gate leakage power reduction. An integer linear programming (ILP) based algorithm is proposed for its optimiza...
Saraju P. Mohanty
ASPDAC
2004
ACM
87views Hardware» more  ASPDAC 2004»
14 years 3 months ago
ShatterPB: symmetry-breaking for pseudo-Boolean formulas
Many important tasks in circuit design and verification can be performed in practice via reductions to Boolean Satisfiability (SAT), making SAT a fundamental EDA problem. However ...
Fadi A. Aloul, Arathi Ramani, Igor L. Markov, Kare...
ISVLSI
2003
IEEE
157views VLSI» more  ISVLSI 2003»
14 years 3 months ago
Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
Shalini Ghosh, Sugato Basu, Nur A. Touba