Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
Madhavi Karkala, Nur A. Touba, Hans-Joachim Wunder...
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...